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Xena Announces General Availability of Unique "Triple-Media" Tri-Speed (100/40/10G) GiG-E Test Module

Unique 100 Gigabit Ethernet test module from Xena delivers provides exceptional flexibility and value.

Copenhagen, October 2015: Xena Networks, the award-winning Gigabit Ethernet Test & Measurement manufacturer announces the general availability of their unique “triple-media” and “tri-speed” 100/40/10G test module for the XenaCompact and XenaBay chassis.

The M1CFP4QSFP28CXP test module supports three transceiver form-factors: CFP4 (CAUI-4), QSFP28 (CAUI-4), and CXP (CAUI) so users can choose any one of these form factors to be active at any time. When the CXP form-factor is selected, the user can, in addition to a single 100G test port, also use the test module to provide two 40G test ports or eight 10G test ports.

“Xena’s new 100G test module is exceptionally popular and already being used by NEMs in both small-scale and terabit installations.”

Triple media support delivers cost-cutting flexibility

“This unique product meets the needs of Network Equipment Manufacturers (NEMs) tasked with testing their equipment in a variety of network environments where they can reasonably expect to encounter all three of these 100G form-factors as well as legacy 100G test interface,” explains CEO Jacob Nielsen.

“By supplying one test module that supports all these interface, we dramatically reduce the cost of testing as now they needn’t invest in 2 or 3 different 100G test modules. The other big benefit is we also support the first-generation CAUI-based SR10 interface used by older 100G test modules. This ensures compatibility and extends the value of investments in legacy T&M equipment.”

Xena’s “tri-speed” feature equals huge value for customers

“The other aspect is that via the CXP interface, we also effectively give customers two 40G test ports or eight 10G test ports for free,” says Jacob Nielsen. “This flexibility and price/performance makes the new test module ideal for BERT, load-stress, and functional testing of Ethernet equipment and network infrastructure.”

Unique “Eye Diagram” Feature

Xena’s M1CFP4QSFP28CXP includes the industry-unique feature of the built-in Bit-Error-Rate (BER) “eye” capture function which provides a direct visual representation of signal quality.

Eye diagram

International Sales Success

Early adopters with advanced R&D engineering divisions confirm the signal integrity performance of the test module is excellent. This has led to Xena securing major orders for the new product from customers in China, the US, Europe and Israel.
“Xena has a large established customer base worldwide and almost half of these are Network Equipment Manufacturers (NEMs),” says Jacob Nielsen. “The new 100G test module has proven exceptionally popular and is already being used by NEMs around the world, in both small-scale and Terabit installations.”

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